Reliability Testing of Ultra-Low Noise InGaAs Quad Photoreceivers (2018)

  
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Abhay M. Joshi 1, Shubhashish Datta1, Narasimha Prasad 2, and Michael Sivertz 3
1 Discovery Semiconductors Inc., Ewing, NJ, USA
2 NASA Langley Research Center, VA, USA
3 NASA Space Radiation Laboratory, Brookhaven National Laboratory, Upton, NY, USA.

ABSTRACT

We have developed ultra-low noise quadrant InGaAs photoreceivers for multiple applications ranging from Laser Interferometric Gravitional Wave Detection, to 3D Wind Profiling. Devices with diameters of 0.5 mm, 1mm, and 2 mm were processed, with the nominal capacitance of a single quadrant of a 1 mm quad photodiode being 2.5 pF. The 1 mm diameter InGaAs quad photoreceivers, using a low-noise, bipolar-input OpAmp circuitry exhibit an equivalent input noise per quadrant of < 1.7 pA/√Hz in 2 to 20 MHz frequency range. The InGaAs Quad Photoreceivers have undergone the following reliability tests: 30 MeV Proton Radiation up to a Total Ionizing Dose (TID) of 50 krad, Mechanical Shock, and Sinusoidal Vibration.


* Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 105261J (23 February 2018); doi: 10.1117/12.2293010
Event: SPIE OPTO, 2018, San Francisco, California, United States

 

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